Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists, Hardback
de: N/A
Publicat de: Taylor & Francis Ltd
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The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.
- Publisher: Taylor & Francis Ltd Author(s): Dong (Nanyang Technological University, Singapore) ZhiLi Number of pages: 272 Collection: Advances in Materials Science and Engineering Publication date: 2022 Dimensions: 241 x 159 x 23 Cover type: Hardback
| General | |
| Anul | 2022 |
| Autor | N/A |
| Cod de bare | 9780367357948 |
| Colectie | Advances in Materials Science and Engineering |
| Editura | Taylor & Francis Ltd |
| Dimensiuni | 241 x 159 |
| ISBN | 0367357941 |
| Pagini | 272 |
| Tara | Marea Britanie |
| Format | Cartonata |
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